equipment - microscopy
Atomic force microscopy (AFM)
A UHV-based high resolution STM & AFM. It has a liquid Helium flow cryostat allowing measurements to be taken over a temperature range of 10 - 1500 K. Other features include Scanning Tunnelling Spectroscopy, Magnetic Force Microscopy and Scanning Kelvin Probe Microscopy.
Technical data
• Matrix control system
• Three modes of operation:
- Contact mode AFM
- Non-contact mode AFM
- STM
These modes provide force/distance and current/voltage spectroscopy measurements. The STM mode provides an atom manipulation facility.
• Scan (and offset) range X/Y/Z: 10μm x 10μm x 1.2μm
• Coarse movement X/Y/Z: 10mm x 10mm x 10mm; Step size: 40nm – 500nm
• Z-resolution: 0.1Ǻ
• Measurements with atomic resolution
• Vibration isolation: Internal eddy current dumping
• Tunneling current: < 1pA – 300nA
• Gap voltage: ±5mV to ±10V; applied to tip/cantilever, sample grounded
• Ultra High Vacuum (UHV) chamber: 10-9-10-11mbar
• Working temperature range: 25K - 750K; with LHe or LN2 cryostat
• Sample heating in preparation stage through direct or radiative methods up to 1000K
Omicron VT AFM
