equipment - microscopy


Atomic force microscopy (AFM)
A UHV-based high resolution STM & AFM. It has a liquid Helium flow cryostat allowing measurements to be taken over a temperature range of 10 - 1500 K. Other features include Scanning Tunnelling Spectroscopy, Magnetic Force Microscopy  and Scanning Kelvin Probe Microscopy.

Technical data
•          Matrix control system
•          Three modes of operation:
            -         Contact mode AFM
            -         Non-contact mode AFM
            -         STM
            These modes provide force/distance and current/voltage spectroscopy measurements. The STM mode provides an atom manipulation facility.
•          Scan (and offset) range X/Y/Z: 10μm x 10μm x 1.2μm
•          Coarse movement X/Y/Z: 10mm x 10mm x 10mm; Step size: 40nm – 500nm
•          Z-resolution: 0.1Ǻ
•          Measurements with atomic resolution
•          Vibration isolation: Internal eddy current dumping
•          Tunneling current: < 1pA – 300nA
•          Gap voltage: ±5mV to ±10V; applied to tip/cantilever, sample grounded
•          Ultra High Vacuum (UHV) chamber: 10-9-10-11mbar
•          Working temperature range: 25K - 750K; with LHe or LN2 cryostat
•          Sample heating in preparation stage through direct or radiative methods up to 1000K

Omicron VT AFM

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